Тип: PDF книга
Жанр: Техническая литература
Язык: на английском языке
Издательство: John Wiley & Sons Limited
Дата публикации: 25.04.2024
Отзывы: Пока нет Добавить отзыв
О книге: Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.